主題：Status of X-ray optics in IMT RAS
　　主講人：Dmitry Roshchupkin 博士
　　地點(diǎn)： 屏峰校區(qū)理A報(bào)告廳
　　時(shí)間：2013年4月25日10：30-11：30
　　主辦單位：理學(xué)院
　　聯(lián)系電話(huà)：85290306
    
　　Introduction：
　　Dmitry Roshchupkin, Deputy head (science) at the Institute of Microelectronics Technology and High-Purity Materials of the Russian Academy of Sciences (IMT RAS，俄羅斯科學(xué)院微電子技術(shù)與高純材料研究所). The creation of elements for X-ray optics of high resolution is one of the strategy courses of IMT RAS. The main application of X-ray elements is connected with the monitoring of the beams of synchrotron radiation, X-ray microscopy of high space resolution, microfluorescent analysis, microdiffraction, microtomography, and X-ray lithography. These elements are widely used both on the sources of synchrotron radiation and laboratory sources of X-ray radiation for the investigations in the fields of solid-state physics, microelectronics, medicine and biology.